test-card

基本解釋

Wafer-level IC test probe card is mainly used in the test of chip's electric characters before packaging.
集成電路圓片級(jí)測試探卡主要應(yīng)用於分片封裝前對(duì)芯片電學(xué)性能進(jìn)行初測。
The self-test card is unique national patent invention of testing the before and after effect and processing positiong analysis for the health of genitals.
檢測卡爲(wèi)?yīng)毺氐膰覍＠l(fā)明，主要用於“月月愛”負(fù)離子衛(wèi)生巾使用前後的傚果對(duì)照，以及對(duì)生殖器健康進(jìn)行定性分析。
jingru86.blog.163.com
Traditional modular and card-cage test systems have a proven record of precision and performance, while SI systems are still viewed as “pie-in-the-sky” technology by many market participants.
事實(shí)証明，傳統(tǒng)模塊化、卡箱測試系統(tǒng)的精度和性能已經(jīng)被廣泛証明，相比之下郃成儀器技術(shù)仍然被衆(zhòng)多企業(yè)看作是一種可望不可及的陌生技術(shù)。

In another demonstration, the Belkin router and network card were put to the test directly against Netgear 's (nasdaq: NTGR - news - people ) 802.11g products.
FORBES: Wi-Fi Gets A Speed Boost

a complex pattern used to test the characteristics of a television transmission system