test-card

基本解釋

Wafer-level IC test probe card is mainly used in the test of chip's electric characters before packaging.
集成電路圓片級測試探卡主要應用于分片封裝前對芯片電學性能進行初測。
The self-test card is unique national patent invention of testing the before and after effect and processing positiong analysis for the health of genitals.
檢測卡為獨特的國家專利發(fā)明，主要用于“月月愛”負離子衛(wèi)生巾使用前后的效果對照，以及對生殖器健康進行定性分析。
jingru86.blog.163.com
Traditional modular and card-cage test systems have a proven record of precision and performance, while SI systems are still viewed as “pie-in-the-sky” technology by many market participants.
事實證明，傳統(tǒng)模塊化、卡箱測試系統(tǒng)的精度和性能已經(jīng)被廣泛證明，相比之下合成儀器技術仍然被眾多企業(yè)看作是一種可望不可及的陌生技術。

In another demonstration, the Belkin router and network card were put to the test directly against Netgear 's (nasdaq: NTGR - news - people ) 802.11g products.
FORBES: Wi-Fi Gets A Speed Boost

a complex pattern used to test the characteristics of a television transmission system