scanning auger electron microscope
基本解釋
- [材料科學(xué)]掃描型奧格電子顯微鏡
英漢例句
- The surface defects of silver coins was analysed with auger electron spectroscopy (AES), Scanning electronic microscope (SEM) and energy dispersive spectrum (EDS).
採(cǎi)用掃描電鏡、能量色散譜和俄歇電子能譜檢測(cè)方法,對(duì)銀幣表麪缺陷進(jìn)行了分析。
雙語(yǔ)例句
專(zhuān)業(yè)釋義
- 掃描型奧格電子顯微鏡