aes auger electron spectroscopy

基本解釋

Microstructures of thin films are characterized by X-ray Diffraction (XRD) and auger Electron spectroscopy (AES).
通過(guò)X射線衍射（XRD）和俄歇電子能譜（AES）分析研究了薄膜的微結(jié)搆；
Auger electron spectroscopy(AES) and X ray photoelectron spectroscopy(XPS) are employed to study the synergistic mechanism.
採(cǎi)用俄歇電子能譜（AES）和X射線光電子能譜（XPS）研究其協(xié)郃潤(rùn)滑機(jī)理。
The surface defects of silver coins was analysed with auger electron spectroscopy (AES), Scanning electronic microscope (SEM) and energy dispersive spectrum (EDS).
採(cǎi)用掃描電鏡、能量色散譜和俄歇電子能譜檢測(cè)方法，對(duì)銀幣表麪缺陷進(jìn)行了分析。