transmission electron microscopy tem
常見例句
- A TecnaiG220AEM instrument was used for the transmission electron microscopy (TEM) study.
透射電鏡(TEM)采用TecnaiG220AEM透射電鏡分析儀。 - The resultant surfaces were characterized by means of SEM, transmission electron microscopy (TEM), X-ray diffraction (XRD), and water contact angle measurements.
用掃描電鏡、透射電鏡、X射線衍射、接觸角測(cè)量等技術(shù)對(duì)表面進(jìn)行了表征。 - The morphologies and structures obtained the anodized aluminum films were characterized by scanning electron microscopy (SEM). transmission electron microscopy (TEM) and atom force microscopy (AFM).
并用掃描電子顯微鏡(SEM)、透射電子顯微鏡(TEM)和原子力顯微鏡(AFM)對(duì)陽極氧化鋁膜的形貌和結(jié)構(gòu)進(jìn)行了表征。 返回 transmission electron microscopy tem