常見(jiàn)例句雙語(yǔ)例句This study is a step to develop a complete physics-of-failure-based reliability prediction methodology for semiconductor light-emitting devices.文中介紹了一種基于概率方法的半導(dǎo)體發(fā)光器件可靠性預(yù)計(jì)模型。 返回 reliability physics