laser plane interferometer

基本解釋

The article describes a new method of measuring semiconductor laser spectrum by plane scanning interferometer.
本文描述了用平面掃描干涉儀測量半導(dǎo)體激光光譜的一種新方法。
To enable dimensional calibrations in the same set-up as for form measurements, a plane-mirror laser interferometer has been added.
使空間的口徑測定能夠在那相同的組合- 向上的當(dāng)做為形式測量，一個飛機- 鏡子激光干涉計有被增加。
Digital laser plane interferometer is used to measure the surface of optical components and the wavefront aberration of non-confocal optical system.
數(shù)字式激光平面干涉儀是用于測量光學(xué)元件面形和無焦光學(xué)系統(tǒng)波像差的光學(xué)儀器。