CAIP

基本解釋

Some critical technologies in CAIP have been investigated.
對檢測規(guī)劃過程中的幾個關(guān)鍵技術(shù)進(jìn)行了研究。
Under the integrated systematic environment, the overall plan of design of object-oriented CAIP system is studied.
在此集成系統(tǒng)中,研究面向?qū)ο蟮腃AIP系統(tǒng)的總體設(shè)計方案。
Cathodic arc ion plating (CAIP) has been widely applied in modern technology field.
多弧離子鍍在現(xiàn)代科技領(lǐng)域中有著廣泛的應(yīng)用。
This model provides interface between CAD and CAIP with the integration of geometric information, tolerance information, measuring elements and surface features.
該模型集成零件的幾何信息、公差信息、測量元素和零件的面構(gòu)成特征等信息,為CAD和CAIP系統(tǒng)設(shè)計了接口。
Computer Aided Inspection Planning (CAIP) is an important and essential component in the modern advanced manufacturing technologies.
計算機輔助檢測規(guī)劃（CAIP）是現(xiàn)代先進(jìn)制造技術(shù)中不可缺少的重要構(gòu)成部分，隨著并行工程（CE）哲理的應(yīng)用和發(fā)展，開展并行工程環(huán) 境下檢測規(guī)劃系統(tǒng)與CAD、CAPP、PPS等的集成研究，是當(dāng)前制造發(fā)展的趨勢之一。