crystallography
基本解釋
- n.結(jié)晶學(xué)；晶體學(xué)
英漢例句
- He and his brother had been acknowledged for their work on crystallography.
他和他的兄弟因在結(jié)晶學(xué)的科學(xué)研究工作，而被社會(huì)所公認(rèn)。 - It's not the first virus to have its structure mapped with x-ray crystallography;
這已經(jīng)不是第一個(gè)利用X射線晶體學(xué)來描繪其結(jié)構(gòu)的病毒。 - In x-ray crystallography, scientists turn large quantities of a protein or virus into crystal form, placing it in front of an x-ray beam.
運(yùn)用X射線晶體學(xué)，科學(xué)家將大量的蛋白質(zhì)或者病毒轉(zhuǎn)換成了晶體形式，將其置于一束X射線光束之前。 - "Using x-ray crystallography to obtain snapshots of the ribosome in action, they have been able to explain how the ribosome selects and couples together amino acids to form proteins."
- And Born worked on a number of things, including the Born exponent, and taught himself crystallography sort of as something to do during World War I.
玻恩也做出了許多貢獻(xiàn)，包括玻恩指數(shù)，他自學(xué)結(jié)晶學(xué),這大約是在一戰(zhàn)期間。
麻省理工公開課 - 固態(tài)化學(xué)導(dǎo)論課程節(jié)選 - It took advantage of X-ray crystallography that charted the precise three-dimensional structure of how Gleevec binds to Bcr-Abl.
FORBES: The Race Is On - X-ray crystallography experiments combined with computational simulations to examine the chemical reactions involved.
ECONOMIST: Biochemistry
雙語例句
原聲例句
權(quán)威例句
詞組短語
- diffraction crystallography [晶體]衍射晶體學(xué)
- morphological crystallography 形態(tài)結(jié)晶學(xué)
- applied crystallography [晶體][物化]應(yīng)用晶體學(xué);應(yīng)用晶體學(xué)英語
- Hydrothermal Crystallography 水熱結(jié)晶學(xué)
- modern crystallography [晶體]現(xiàn)代結(jié)晶學(xué)
短語
英英字典
- the science concerned with the formation, properties, and structure of crystals
柯林斯英英字典
專業(yè)釋義
- 晶體結(jié)構(gòu)
Their structures had been determined by Elemental analyses, IR, ~1H-NMR and ~(13)C-NMR spectroscopy and X-ray crystallography.
用核磁共振、紅外光譜、X-衍射、元素分析等手段進(jìn)行表征,培養(yǎng)單晶并測(cè)定了其晶體結(jié)構(gòu)。 - 結(jié)晶學(xué)
- 晶體學(xué)
The barrier performances of double barriers with SiON and Ta layers and Ta barriers were tested by using second ion mass spectrometry(SIMS). Crystallography orientation structures of Cu films with and without Ta barriers were studied by using X-ray diffraction(XRD).
采用二次離子質(zhì)譜儀(SIMS)測(cè)試了SiON和Ta雙層擴(kuò)散阻擋層及Ta擴(kuò)散阻擋層的阻擋性能;采用X射線衍射儀(XRD)測(cè)量了沉積態(tài)有Ta阻擋層和無阻擋層Cu膜的晶體學(xué)取向結(jié)構(gòu);利用電子薄膜應(yīng)力測(cè)試儀測(cè)量了具有雙層阻擋層Cu膜的應(yīng)力分布狀況。生物學(xué)
- 結(jié)晶學(xué)
- 晶體學(xué)
- 結(jié)晶學(xué)
- 結(jié)晶學(xué)
- 晶體學(xué)
- 結(jié)晶學(xué)
- 晶體學(xué)
- 晶體學(xué)