ATPG
基本解釋
- 測(cè)試生成
英漢例句
- An automatic test pattern generation (ATPG) algorithm for deliberately selected delay faults is presented to cope with the crosstalk-induced delay effects on longer paths.
由于電路中較長(zhǎng)的通路具有較短的松弛時(shí)間，因此容易因?yàn)榇當(dāng)_問題產(chǎn)生時(shí)延故障。 - With the development of the VLSI te chnology and the improvement of computer performance,parallel ATPG is necessary and feasible.
隨著VLSI技術(shù)的發(fā)展和計(jì)算機(jī)性能的提高，并行測(cè)試生成系統(tǒng)不僅必需而且可行。 - The BSDL language that describes boundary scan components is thoroughly studied, and then applied to boundary scan ATPG tools and fault diagnosis software.
摘要在對(duì)描述器件邊界掃描特性的BSDL語(yǔ)言進(jìn)行了深入研究之后，將其應(yīng)用于邊界掃描自動(dòng)測(cè)試圖形生成ATPG與故障診斷軟件中。 - This paper presents a preimage computation approach used in unbounded model checking.The approach combines ATPG and SAT engines effectively and makes full use of their respective advantages.
提出一種無(wú)界模型檢驗(yàn)的前像計(jì)算方法;該方法有效地結(jié)合ATPG和SAT引擎;充分利用引擎各自的優(yōu)點(diǎn). - For substituting the test vectors generated by the circuit under test for the pseudo-random vectors supplied by a LFSR,this paper proposes an ATPG algorithm based on genetic algorithm.
本文針對(duì)由被測(cè)電路自己產(chǎn)生測(cè)試向量取代LFSR偽隨機(jī)向量,提出一種基于遺傳算法的自動(dòng)測(cè)試向量生成算法。